Patents

Total 15
Patents 목록
NO SUBJECT FILE
15 [NO.14] J. H. Lee, “Optical apparatus for inspecting pattern image of semiconductor wafer,” Korea Patent No. 10–1826127, 2018. 관리자 05-28
14 [NO.15] J. H. Lee, “Apparatus for testing surface height of object and method of the testing,” Korea Patent No. 10-2018–0031259, 2018. 관리자 05-28
13 [NO.13] Y. taec Kim et al., “Photovoltaic module 30-0920980,” 2017. 관리자 05-28
12 [NO.12] Y. taec Kim et al., “Photovoltaic module 30-0920978,” 2017. 관리자 05-28
11 [NO.11] Y. taec Kim et al., “Photovoltaic module 30-0920979,” 2017. 관리자 05-28
10 [NO.10] Y. taec Kim et al., “Photovoltaic Structure 30-0920981,” 2017. 관리자 05-28
9 [NO.09] J. H. Lee, “Method of enhancing resolution for optical apparatus for inspecting pattern image of semiconductor wafer and method of acquiring TSOM image using the same,” Korea Patent No.10-2017–0050477, 2017. 관리자 05-28
8 [NO.08] J. H. Lee, “Optical apparatus for examining pattern image of semiconductor wafer,” Korea Patent No. 10–1652355, 2016. 관리자 05-28
7 [NO.07] J. H. Lee, “Optical apparatus for inspecting pattern image of semiconductor wafer,” Korea Patent No. 10-2016–0107104, 2016. 관리자 05-28
6 [NO.06] J. H. Lee, “Optical apparatus for examining pattern image of semiconductor device,” Korea Patent No. 10–1652356, 2016. 관리자 05-28
5 [NO.05] J. H. Lee, J. I. Lee, and J. Y. Jung, “Guide lamp for vehicles,” Korea Patent No. 10–1458048, 2014. 관리자 05-28
4 [NO.04] D. J. Go, J. H. Lee, S. J. Noh, and J. H. Yu, “Light emitting apparatus,” Korea Patent No. 10-2014–0122934, 2014. 관리자 05-28
3 [NO.03] J. W. Lim and J. H. Lee, “Optical detection module for Wafer inspection,” Korea Patent No. 10–1146922, 2012. 관리자 05-28
2 [NO.02] J. H. Lee and Y. K. Sohn, “Optical system for wide angle camera,” Korea Patent No. 10–1093491, 2011. 관리자 05-28
1 [NO.01] E.-C. Jeon, J. gu Kim, T. jin Jae, Y. E. You, D. S. Choi, and J. H. Lee, “Light guide plate and back light assemlby having the same,” Korea Patent No. 10–0988936, 2010. 관리자 05-28
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