Patents
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1 J. H. Lee, “Method of enhancing resolution for optical apparatus for inspecting pattern image of semiconductor wafer and method of acquiring TSOM image using the same,” Korea Patent No. 10-2017-0050477, 2017.
2 J. H. Lee, “Optical apparatus for examining pattern image of semiconductor device,” Korea Patent No. 10-1652356, 2016.
3 J. H. Lee, “Optical apparatus for examining pattern image of semiconductor wafer,” Korea Patent No. 10-1652355, 2016.
4 J. H. Lee, “Optical apparatus for inspecting pattern image of semiconductor wafer,” Korea Patent No. 10-2016-0107104, 2016.
5 D. J. Go, J. H. Lee, S. J. Noh, and J. H. Yu, “Light emitting apparatus,” Korea Patent No. 10-2014-0122934, 2014.
6 J. H. Lee, J. I. Lee, and J. Y. Jung, “Guide lamp for vehicles,” Korea Patent No. 10-1458048, 2014.
7 J. W. Lim and J. H. Lee, “Optical detection module for Wafer inspection,” Korea Patent No.10-1146922, 2012.
8 J. H. Lee and Y. K. Sohn, “Optical system for wide angle camera,” Korea Patent No. 10-1093491, 2011.
9 E.-C. Jeon, J. gu Kim, T. jin Jae, Y. E. You, D. S. Choi, and J. H. Lee, “Light guide plate and back light assemlby having the same,” Korea Patent No. 10-0988936, 2010.